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1 april 7, 2005 U635H64 powerstore 8k x 8 nvsram pin configuration pin description top view 1 n.c. vcc 28 2 a12 w 27 4 a6 a8 25 5 a5 a9 24 3 a7 n.c. 26 6 a4 a11 23 7 a3 g 22 8 a2 a10 21 12 dq1 dq5 17 9 a1 e 20 10 a0 dq7 19 11 dq0 dq6 18 13 dq2 dq4 16 14 vss dq3 15 pdip sop signal name signal description a0 - a12 address inputs dq0 - dq7 data in/out e chip enable g output enable w write enable vcc power supply voltage vss ground s high-performance cmos non- volatile static ram 8192 x 8 bits s 25, 35 and 45 ns access times s 12, 20 and 25 ns output enable access times s i cc = 15 ma at 200 ns cycle time s automatic store to eeprom on power down using system capacitance s software initiated store (store cycle time < 10 ms) s automatic store timing s 10 5 store cycles to eeprom s 10 years data retention in eeprom s automatic recall on power up s software recall initiation (recall cycle time < 20 s) s unlimited recall cycles from eeprom s single 5 v 10 % operation s operating temperature ranges: 0 to 70 c -40 to 85 c s qs 9000 quality standard s esd characterization according- mil std 883c m3015.7-hbm (classification see ic code numbers) s rohs compliance and pb- free s packages: pdip28 (600 mil) sop28 (330 mil) description the U635H64 has two separate modes of operation: sram mode and nonvolatile mode. in sram mode, the memory operates as an ordinary static ram. in nonvolatile operation, data is transferred in parallel from sram to eeprom or from eeprom to sram. in this mode sram functions are disab- led. the U635H64 is a fast static ram (25, 35, 45 ns), with a nonvolatile electrically erasable prom (eeprom) element incorporated in each static memory cell. the sram can be read and written an unlimited number of times, while independent nonvolatile data resi- des in eeprom. data transfers from the sram to the eeprom (the store operation) take place automatically upon power down using charge stored in system capacitance. transfers from the eeprom to the sram (the recall operation) take place automatically on power up. the U635H64 combines the high performance and ease of use of a fast sram with nonvolatile data integrity. store cycles also may be initia- ted under user control via a soft- ware sequence. once a store cycle is initiated, further input or output are disabled until the cycle is completed. because a sequence of addresses is used for store initiation, it is important that no other read or write accesses intervene in the sequence or the sequence will be aborted. recall cycles may also be initia- ted by a software sequence. internally, recall is a two step procedure. first, the sram data is cleared and second, the nonvolatile information is transferred into the sram cells. the recall operation in no way alters the data in the eeprom cells. the nonvolatile data can be recalled an unlimited number of times. features
2 april 7, 2005 U635H64 block diagram operating mode e w g dq0 - dq7 standby/not selected h ** high-z internal read l h h high-z read l h l data outputs low-z write l l * data inputs high-z truth table for sram operations a: stresses greater than those listed under ?absolute maximum ratings? may cause permanent damage to the device. this is a stre ss rating only, and functional operation of the device at condition above those indicated in the operational sections of this spe cification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. absolute maximum ratings a symbol min. max. unit power supply voltage v cc -0.5 7 v input voltage v i -0.3 v cc +0.5 v output voltage v o -0.3 v cc +0.5 v power dissipation p d 1w operating temperature c-type k-type t a 0 -40 70 85 c c storage temperature t stg -65 150 c characteristics all voltages are referenced to v ss = 0 v (ground). all characteristics are valid in the power supply voltage range and in the operating temperature range specified. dynamic measurements are based on a rise and fall time of 5 ns, measured between 10 % and 90 % of v i ,as well as input levels of v il = 0 v and v ih = 3 v. the timing reference level of all input and output signals is 1.5 v, with the exception of the t dis -times and t en -times, in which cases transition is measured 200 mv from steady-state voltage. * h or l eeprom array 128 x (64 x 8) store recall sram array 128 rows x 64 x 8 columns a5 a6 a7 a8 a9 a11 a12 a0 - a12 store/ recall control row decoder v cc v ss g e w software detect power control v cc dq0 dq1 dq2 dq3 dq4 dq5 dq6 dq7 column i/o column decoder a0 a1 a2 a3 a4 a10 input buffers
3 april 7, 2005 U635H64 b: i cc1 and i cc3 are depedent on output loading and cycle rate. the specified values are obtained with outputs unloaded. the current i cc1 is measured for write/read - ratio of 1/2. c: i cc2 and i cc4 are the average currents required for the duration of the respective store cycles (store cycle time). d: bringing e v ih will not produce standby current levels until any nonvolatile cycle in progress has timed out. see mode selection table. the current i cc(sb)1 is measured for write/read - ratio of 1/2. dc characteristics symbol conditions c-type k-type unit min. max. min. max. operating supply current b i cc1 v cc v il v ih t c t c t c = 5.5 v = 0.8 v = 2.2 v = 25 ns = 35 ns = 45 ns 90 80 75 95 85 80 ma ma ma average supply current during store c i cc2 v cc e w v il v ih = 5.5 v 0.2 v v cc -0.2 v 0.2 v v cc -0.2 v 67ma average supply current during powerstore cycle c i cc4 v cc v il v ih = 4.5 v = 0.2 v v cc -0.2 v 44ma standby supply current d (cycling ttl input levels) i cc(sb)1 v cc e t c t c t c = 5.5 v = v ih = 25 ns = 35 ns = 45 ns 30 23 20 34 27 23 ma ma ma operating supply current at t cr = 200 ns b (cycling cmos input levels) i cc3 v cc w v il v ih = 5.5 v v cc -0.2 v 0.2 v v cc -0.2 v 15 15 ma standby supply curent d (stable cmos input levels) i cc(sb) v cc e v il v ih = 5.5 v v cc -0.2 v 0.2 v v cc -0.2 v 33ma recommended operating conditions symbol conditions min. max. unit power supply voltage v cc 4.5 5.5 v input low voltage v il -2 v at pulse width 10 ns permitted -0.3 0.8 v input high voltage v ih 2.2 v cc +0.3 v
4 april 7, 2005 U635H64 dc characteristics symbol conditions c-type k-type unit min. max. min. max. output high voltage output low voltage v oh v ol v cc i oh i ol = 4.5 v =-4 ma = 8 ma 2.4 0.4 2.4 0.4 v v output high current output low current i oh i ol v cc v oh v ol = 4.5 v = 2.4 v = 0.4 v 8 -4 8 -4 ma ma input leakage current high low i ih i il v cc v ih v il = 5.5 v = 5.5 v = 0 v -1 1 -1 1 a a output leakage current high at three-state- output low at three-state- output i ohz i olz v cc v oh v ol = 5.5 v = 5.5 v = 0 v -1 1 -1 1 a a sram memory operations no. switching characteristics read cycle symbol 25 35 45 unit alt. iec min. max. min. max. min. max. 1 read cycle time f t avav t cr 25 35 45 ns 2 address access time to data valid g t avqv t a(a) 25 35 45 ns 3 chip enable access time to data valid t elqv t a(e) 25 35 45 ns 4 output enable access time to data valid t glqv t a(g) 12 20 25 ns 5e high to output in high-z h t ehqz t dis(e) 13 17 20 ns 6g high to output in high-z h t ghqz t dis(g) 13 17 20 ns 7e low to output in low-z t elqx t en(e) 555 ns 8g low to output in low-z t glqx t en(g) 000 ns 9 output hold time after address change t axqx t v(a) 333 ns 10 chip enable to power active e t elicch t pu 000 ns 11 chip disable to power standby d, e t ehiccl t pd 25 35 45 ns e: parameter guaranteed but not tested. f: device is continuously selected with e and g both low. g: address valid prior to or coincident with e transition low. h: measured 200 mv from steady state output voltage.
5 april 7, 2005 U635H64 high impedance read cycle 1: ai-controlled (during read cycle: e = g = v il , w = v ih ) f read cycle 2: g -, e -controlled (during read cycle: w = v ih ) g no. switching characteristics write cycle symbol 25 35 45 unit alt. #1 alt. #2 iec min. max. min. max. min. max. 12 write cycle time t avav t avav t cw 25 35 45 ns 13 write pulse width t wlwh t w(w) 20 30 35 ns 14 write pulse width setup time t wleh t su(w) 20 30 35 ns 15 address setup time t av w l t avel t su(a) 000ns 16 address valid to end of write t avwh t aveh t su(a-wh) 20 30 35 ns 17 chip enable setup time t elwh t su(e) 20 30 35 ns 18 chip enable to end of write t eleh t w(e) 20 30 35 ns 19 data setup time to end of write t dvwh t dveh t su(d) 12 18 20 ns 20 data hold time after end of write t whdx t ehdx t h(d) 000ns 21 address hold after end of write t whax t ehax t h(a) 000ns 22 w low to output in high-z h, i t wlqz t dis(w) 10 13 15 ns 23 w high to output in low-z t whqx t en(w) 555ns t a(a) previous data valid output data valid t cr address valid t v(a) (1) (2) (9) t dis(e) t cr t a(e) t en(e) t en(g) t a(g) t dis(g) output data valid active standby t pd t pu (1) (3) (4) (5) (7) (6) (8) (10) (11) t a(a) (2) address valid ai dqi output ai e g dqi output i cc dqi output
6 april 7, 2005 U635H64 l- to h-level undefined h- to l-level i: if w is low and when e goes low, the outputs remain in the high impedance state. j: e or w must be v ih during address transition. write cycle #1: w -controlled j write cycle #2: e -controlled j t h(d) ai e w dqi input dqi output t cw t su(e) t h(a) t w(w) t su(d) t dis(w) t en(w) address valid input data valid high impedance t su(a-wh) (12) (16) (13) (19) (20) (23) (21) t su(a) t h(d) ai e w dqi input dqi output t cw t w(e) t h(a) t su(d) address valid input data valid t su(w) (12) (18) (21) (20) (19) previous data high impedance t su(a) (17) (15) (22) (15) (14)
7 april 7, 2005 U635H64 nonvolatile memory operations mode selection e w a12 - a0 (hex) mode i/o power notes h x x not selected output high z standby l h x read sram output data active m l l x write sram input data active l h 0000 1555 0aaa 1fff 10f0 0f0f read sram read sram read sram read sram read sram nonvolatile store output data output data output data output data output data output high z active k, l k, l k, l k, l k, l k l h 0000 1555 0aaa 1fff 10f0 0f0e read sram read sram read sram read sram read sram nonvolatile recall output data output data output data output data output data output high z active k, l k, l k, l k, l k, l k k: the six consecutive addresses must be in order listed (0000, 1555, 0aaa, 1fff, 10f0, 0f0f) for a store cycle or (0000, 1555, 0aaa, 1fff,10f0, 0f0e) for a recall cycle. w must be high during all six consecutive cycles. see store cycle and recall cycle tables and diagrams for further details. the following six-address sequence is used for testing purposes and should not be used: 0000, 1555, 0aaa, 1fff, 10f0, 139c. l: activation of nonvolatile cycles does not depend on the state of g . m: i/o state assumes that g v il . no. powerstor e power up recall symbol conditions min. max. unit alt. iec 24 power up recall duration n, e t restore 650 s 25 store cycle duration f t pdstore the power supply vol- tage must stay above 3.6 v for at least 10 ms after the start of the store operation 10 ms 26 time allowed to complete sram cycle f, e t delay 1 s low voltage trigger level v switch 4.0 4.5 v n: t restore starts from the time v cc rises above v switch .
8 april 7, 2005 U635H64 powerstore and automatic power up recall o: the software sequence is clocked with e controlled reads. p: once the software controlled store or recall cycle is initiated, it completes automatically, ignoring all inputs. q: note that store cycles (but not recall) are aborted by v cc < v switch (store inhibit). r: an automatic recall also takes place at power up, starting when v cc exceeds v switch and takes t restore . v cc must not drop below v switch once it has been exceeded for the recall to function properly. s: noise on the e pin may trigger multiple read cycles from the same address and abort the address sequence. t: if the chip enable pulse width is less than t a(e) (see read cycle) but greater than or equal t w(e)sr , than the data may not be valid at the end of the low pulse, however the store or recall will still be initiated. no. software controlled store/ recall cycle k, o symbol 25 35 45 unit alt. iec min. max. min. max. min. max. 27 store/recall initiation time t avav t cr 25 35 45 ns 28 chip enable to output inactive p t elqz t dis(e)sr 600 600 600 ns 29 store cycle time q t elqxs t d(e)s 10 10 10 ms 30 recall cycle time r t elqxr t d(e)r 20 20 20 s 31 address setup to chip enable s t aveln t su(a)sr 000ns 32 chip enable pulse width s, t t elehn t w(e)sr 20 25 35 ns 33 chip disable to address change s t ehaxn t h(a)sr 000ns v cc 5.0 v t powerstore power up v switch w dqi power up recall brown out t restore t restore brown out powerstore (no sram writes) recall (24) (24) t pdstore p (25) t delay (26) no store
9 april 7, 2005 U635H64 u: w must be high when e is low during the address sequence in order to initiate a nonvolatile cycle. g may be either high or low throughout. addresses 1 through 6 are found in the mode selection table. address 6 determines whether the U635H64 performs a st ore or recall. v: e must be used to clock in the address sequence for the software controlled store and recall cycles. ai e dqi output t cr t w(e)sr high impedance address 1 valid valid software controlled store/recall cycle s, t, u, v (e = high after store initiation) address 6 (27) (27) t h(a)sr (33) (32) t su(a)sr (31) ai e dqi output t cr t w(e)sr high impedance address 1 valid valid address 6 t d(e)s (29) (30) (27) t h(a)sr (33) (32) t su(a)sr (31) t dis(e)sr (28) t h(a)sr (33) t su(a)sr (31) t w(e)sr t h(a)sr (33) (32) t su(a)sr (31) (5) t dis(e) software controlled store/recall cycle s, t, u, v ( e = low after store initiation) t d(e)s (29) (30) t dis(e)sr (28) t d(e)r t d(e)r t cr
10 april 7, 2005 U635H64 test configuration for functional check v ih v il v ss v cc x 480 255 30 pf w v o simultaneous measure- ment of all 8 output pins input level according to the relevant test measurement dq0 dq1 dq2 dq3 dq4 dq5 dq6 dq7 a0 a1 a2 a3 a4 a5 a6 a7 a8 a9 a10 a11 a12 e w g 5 v w: in measurement of t dis -times and t en -times the capacitance is 5 pf. x: between v cc and v ss must be connected a high frequency bypass capacitor 0.1 f to avoid disturbances. capacitance e conditions symbol min. max. unit input capacitance v cc v i f t a = 5.0 v = v ss = 1 mhz = 25 c c i 8pf output capacitance c o 7pf all pins not under test must be connected with ground by capacitors. operating temperature range c = 0 to 70 c k = -40 to 85 c 25 c s U635H64 type esd class blank > 2000 v b > 1000 v package d1 = pdip28 (600 mil) s = sop28 (330 mil) type 1 s2 = sop28 (330 mil) type 2 ordering code leadfree option blank = standard package g1 = leadfree green package y access time 25 = 25 ns 35 = 35 ns y 45 = 45 ns y device marking (example) y: on special request example g1 date of manufacture (the first 2 digits indicating the year, and the last 2 digits the calendar week.) leadfree green package product specification internal code zmd U635H64s2c 25 z 0425 g1
11 april 7, 2005 U635H64 device operation the U635H64 has two separate modes of operation: sram mode and nonvolatile mode. in sram mode, the memory operates as a standard fast static ram. in nonvolatile mode, data is transferred from sram to eeprom (the store operation) or from eeprom to sram (the recall operation). in this mode sram functions are disabled. store cycles may be initiated under user control via a software sequence and are also automatically initiated when the power supply voltage level of the chip falls below v switch . recall operations are automatically initiated upon power up and may occur also when v cc rises above v switch after a low power condition. recall cycles may also be initiated by a software sequence. sram read the U635H64 performs a read cycle whenever e and g are low and w are high. the address specified on pins a0 - a12 determines which of the 8192 data bytes will be accessed. when the read is initiated by an address transition, the outputs will be valid after a delay of t cr . if the read is initiated by e or g , the outputs will be valid at t a(e) or at t a(g) , whichever is later. the data outputs will repeatedly respond to address changes within the t cr access time without the need for transition on any control input pins, and will remain valid until another address change or until e or g is brought high or w is brought low. sram write a write cycle is performed whenever e and w are low. the address inputs must be stable prior to entering the write cycle and must remain stable until either e or w goes high at the end of the cycle. the data on pins dq0 - 7 will be written into the memory if it is valid t su(d) before the end of a w controlled write or t su(d) before the end of an e controlled write. it is recommended that g is kept high during the en- tire write cycle to avoid data bus contention on the common i/o lines. if g is left low, internal circuitry will turn off the output buffers t dis(w) after w goes low. automatic store the U635H64 uses the intrinsic system capacitance to perform an automatic store on power down. as long as the system power supply take at least t pdstore to decay from v switch down to 3.6 v the U635H64 will safely and automatically store the sram data in eeprom on power down. in order to prevent unneeded store operations, auto- matic store will be ignored unless at least one write operation has taken place since the most recent store or recall cycle. software initiated store cycles are performed regardless of whether or not a write operation has taken place. automatic recall during power up an automatic recall takes place. after any low power condition (v cc < v switch ) an inter- nal recall request may be latched. when v cc once again exceeds the sense voltage of v switch , a reque- sted recall cycle will automatically be initiated and will take t restore to complete. if the U635H64 is in a write state at the end of a power up recall, the sram data will be corrupted. to help avoid this situation, a 10 k ? resistor should be connected between w and system v cc . software nonvolatile store the U635H64 software co ntrolled store cycle is initiated by executing sequential read cycles from six specific address locations. by relying on read cycles only, the U635H64 implements nonvolatile operation while remaining compatible with standard 8k x 8 srams. during the store cycle, an erase of the pre- vious nonvolatile data is performed first, followed by a parallel programming of all nonvolatile elements. once a store cycle is initiated, further inputs and outputs are disabled until the cycle is completed. because a sequence of addresses is used for store initiation, it is important that no other read or write accesses intervene in the sequence or the sequence will be aborted. to initiate the store cycle the following read sequence must be performed: 1. read address 0000 (hex) valid read 2. read address 1555 (hex) valid read 3. read address 0aaa (hex) valid read 4. read address 1fff (hex) valid read 5. read address 10f0 (hex) valid read 6. read address 0f0f (hex) initiate store once the sixth address in the sequence has been entered, the store cycle will commence and the chip will be disabled. it is important that read cycles and not write cycles are used in the sequence, although it is not necessary that g is low for the sequence to be valid. after the t store cycle time has been fulfilled, the sram will again be activated for read and write operation.
12 april 7, 2005 U635H64 software nonvolatile recall a recall cycle of the eeprom data into the sram is initiated with a sequence of read operations in a manner similar to the store initiation. to initiate the recall cycle the following sequence of read opera- tions must be performed: 1. read address 0000 (hex) valid read 2. read address 1555 (hex) valid read 3. read address 0aaa (hex) valid read 4. read address 1fff (hex) valid read 5. read address 10f0 (hex) valid read 6. read address 0f0e (hex) initiate recall internally, recall is a two step procedure. first, the sram data is cleared and second, the nonvolatile information is transferred into the sram cells. the recall operation in no way alters the data in the eeprom cells. the nonvolatile data can be recalled an unlimited number of times. hardware protection the U635H64 offers hardware protection against inad- vertent store operation through v cc sense. when v cc < v switch all software controlled store operati- ons will be inhibited. low average active power the U635H64 has been designed to draw significantly less power when e is low (chip enabled) but the access cycle time is longer than 55 ns. when e is high the chip consumes only standby cur- rent. the overall average current drawn by the part depends on the following items: 1. cmos or ttl input levels 2. the time during which the chip is disabled (e high) 3. the cycle time for accesses (e low) 4. the ratio of reads to writes 5. the operating temperature 6. the v cc level the information describes the type of component and shall not be considered as assured characteristics. terms of delivery and rights to change design reserved.
zentrum mikroelektronik dresden ag grenzstra?e 28 ? d-01109 dresden ? p. o. b. 80 01 34 ? d-01101 dresden ? germany phone: +49 351 8822 306 ? fax: +49 351 8822 337 ? email: memory@zmd.de ? http://www.zmd.de U635H64 april 7, 2005 life support policy zmd products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the zmd product could create a situation where personal injury or death may occur. components used in life-support devices or systems must be expressly authorized by zmd for such purpose. limited warranty the information in this document has been carefully checked and is believed to be reliable. however zentrum mikroelektronik dresden ag (zmd) makes no guarantee or warranty concerning the accuracy of said information and shall not be responsible for any loss or damage of whatever nature resulting from the use of, or reliance upon it. the information in this document describes the type of component and shall not be considered as assured charac- teristics. zmd does not guarantee that the use of any information contained herein will not infringe upon the patent, trade- mark, copyright, mask work right or other rights of third parties, and no patent or licence is implied hereby. this document does not in any way extent zmd?s warranty on any product beyond that set forth in its standard terms and conditions of sale. zmd reserves terms of delivery and reserves the right to make changes in the products or specifications, or both, presented in this publication at any time and without notice.

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