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revisions ltr description date (yr - mo - da) approved a update boilerplate to reflect current requirements. - rrp 01 - 11 - 16 r. monnin b redrawn. update paragraphs to mil - prf - 38535 requirements. - drw 13 - 06 - 13 charles f. saf fle rev sheet rev sheet rev status rev b b b b b b b b b b b of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 pmic n/a prepared by dan wonnell dla land and maritime columbus, ohio 43218 - 3990 http://www.landandmaritime.dla.mil standard microcircuit drawing this drawing is available for use by all departments and agencies of the department of defense checked by sandra rooney approved by michael a. frye microcircuit, digital - linear , fast, serial, 16- bit, a/d converter, m u ltic hip silicon drawing approval date 96- 01- 16 amsc n/a revision level b size a cage code 67268 5962- 95592 sheet 1 of 11 dscc form 2233 apr 97 5962- e 462- 13
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents two product assurance class levels consisting of high reliability (device classes q and m) and space application (device class v). a choice of case outlines and lead finishes are available and are reflected in th e part or identif ying number (pin). when available, a choice of radiation hardness assurance (rha) levels is reflected in the pin. 1.2 pin . the pin is as shown in the following example: 5962 - 95592 01 m e a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) device class designator case outline (see 1.2.4) lead finish (see 1.2.5) \ / (see 1.2.3) \ / drawing number 1.2.1 rha designator . device classes q and v rha marked devices meet the mil - prf - 38535 specified rha levels and are marked with the appropriate rha designator. device class m rha marked devices meet the mil - prf - 38535, appendix a specified rha levels and are marked with the app ropriate rha designator. a dash ( - ) indicates a non- rha device. 1.2.2 device type . the device type identifies the circuit function as follows: device type generic number circuit function 01 ad677 16- bit, 100 ksps, serial, a/d converter 1.2.3 device class designator . the device class designator is a single letter identifying the product assurance level as follows: device class device requirements documentation m vendor self - certification to the requirements for mil- std - 883 compliant, non- j an class level b microcircuits in accordance with mil - prf - 38535, appendix a q or v certification and qualification to mil - prf -38535 1.2.4 case outline . the case outline is as designated in mil - std - 1835 as follows: outline letter descriptive designato r terminals package style e cdip2 - t16 16 dual -in - line 1.2.5 lead finish . the lead finish is as specified in mil - prf - 38535 for device classes q and v or mil- prf - 38535, appendix a for device class m.
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 3 dscc form 2234 apr 97 1.3 absolute maximum ratings . 1 / v cc to v ee .................................................................................................... - 0.3 v dc to +26.4 v dc v dd to dgnd ............................................................................................... - 0.3 v dc to +7 v dc v cc to agnd ............................................................................................... - 0.3 v dc to +18 v dc v ee to agnd ................................................................................................ - 18 v dc to +0.3 v dc agnd to dgnd ........................................................................................... mil - prf -38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil - std -883 - test method standard microcircuits. mil - std -1835 - interface standard electronic component case outlines. department of defense handbooks mil - hdbk -103 - list of standard microcircuit drawings. mil - hdbk -780 - standard microcircuit drawings. (copies of these documents are available online at http :// quicksearch .dla.mil or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111 - 5094.) 2.2 order of precedence . i n the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. ________ 1 / stresses above the absolute maximum rating may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2 / agnd and dgnd tied at adc.
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 4 dscc form 2234 apr 97 3. requirements 3.1 item requirements . the individual item requirements for device classes q and v shall be in accordance with mil - prf - 38535 as specified herein, or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. the individual item requirement s for device class m shall be in accordance with mi l - prf - 38535, appendix a for non- jan class level b devices and as specified herein. 3.2 design, construction, and physical dimensions . the design, construction, and physical dimensions shall be as specified in mil - prf - 38535 and herein for device classes q and v or mil - prf - 38535, appendix a and herein for device class m. 3.2.1 case outline . the case outline shall be in accordanc e with 1.2.4 herein . 3.2.2 terminal connections . the terminal connections shall be as specified on figure 1 . 3.3 electrical performance characteristics and postirradiation parameter limits . unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table i and shall apply over the full ambie nt operating temperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii. the electrical tests for each subgroup are defined in table i. 3.5 marking . the part shall be marked w ith the pin listed in 1.2 herein. in addition, the manufacturer's pin may also be marked. for packages where marking of the entire smd pin number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962 - " on the device. for rha product using this option, the rha designator shall still be marked. marking for device classes q and v shall be in accordance with mil - prf - 38535. marking for device class m shall be in accordance with mil - prf - 38535, appendix a. 3.5.1 certification/compliance mark . the certification mark for device classes q and v shall be a "qml" or "q" as required in mil - prf - 38535. the compliance mark for device class m shall be a "c" as required in mil- prf - 38535, appendix a. 3.6 certificate of compliance . for device classes q and v, a certificate of compliance shall be required from a qml - 38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). for device class m, a certifi cate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in mil - hdbk - 103 (see 6.6.2 herein). the certificate of compliance submitted to dla land and maritime - va prior to listing as an approved source of supply for this drawing s hall affirm that the manufacturer's product meets, for device classes q and v, the requirements of mil - prf - 38535 and herein or for device class m, the requirements of mil- prf - 38535, appendix a and herein. 3.7 certificate of conformance . a certificate of conformance as required for device classes q and v in mil - prf - 38535 or for device class m in mil - prf - 38535, appendix a shall be provided with each lot of microcircuits delivered to this drawing. 3.8 notification of change for device class m . for dev ice class m, notification to dla land and maritime - va of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 verification and review for device class m . for device cla ss m, dla land and maritime , dla land and maritime?s agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. of fshore documentation shall be made available onshore at the option of t he reviewer. 3.10 microcircuit group assignment for device class m . device class m devices covered by this drawing shall be in microcircuit group number h (see mil - prf - 38535, appendix a).
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions -55
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions -55
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 7 dscc form 2234 apr 97 device type 01 case outline e terminal number terminal symbol 1 sample 2 clk 3 sdata 4 dgnd 5 v cc 6 nc 7 nc 8 agnd 9 agnd sense 10 v in 11 v ref 12 v ee 13 v dd 14 sclk 15 busy 16 cal nc = no connect figure 1 . terminal connections .
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 8 dscc form 2234 apr 97 note: shaded portions of input signals are optional. for best performance, it is recommended that these signals be held low except when explicitly shown high. figure 2 . timing waveforms .
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 9 dscc form 2234 apr 97 4. verification 4.1 sampling and inspection . for device classes q and v, sampling and inspection procedures shall be in accordance with mil - prf - 38535 or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. for device class m, sampling and inspection procedures shal l be in accordance with mil - prf - 38535, appendix a. 4.2 screening . for de vice classes q and v, screening shall be in accordance with mil - prf - 38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. for device class m, screening shall be in accordance with method 5004 of mil - std - 883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 additional criteria for device class m . a. burn - in test, method 1015 of mil- std -883. (1) test condition a, b, c, or d . the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with th e intent specified in method 1015 of mil - std -883. (2) t a = +125
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 10 dscc form 2234 apr 97 4.4.1 group a inspection . a. tests shall be as specified in tab le ii herein. b. subgroups 7 and 8 in table i, method 5005 of mil - std - 883 shall be omitted. table ii. electrical test requirements . test requirements subgroups (in accordance with mil - std - 883, method 5005, table i) subgroups (in accordance with mil - prf - 38535, table iii) device class m device class q device class v interim electrical parameters (see 4.2) 1 1 1 final electrical parameters (see 4.2) 1, 2, 3, 4, 5, 6, 9, 10, 11 1 / 1, 2, 3, 4, 5, 6, 9, 10, 11 1 / 1, 2, 3, 4, 5, 6, 9, 10, 11 1 / group a test requirements (see 4.4) 1, 2, 3, 4, 5, 6, 9, 10, 11 1, 2, 3, 4, 5, 6, 9, 10, 11 1, 2, 3, 4, 5, 6, 9, 10, 11 group c end - point electrical parameters (see 4.4) 1 1 1, 2, 3, 4, 5, 6, 9, 10, 11 group d end - point electrical parameters (see 4.4) 1 1 1, 4, 9 group e end - point electrical parameters (see 4.4) 1 1 1, 4, 9 1 / pda applies to subgroup 1. 4.4.2 group c inspection . the group c inspection end - point electrical parameters shall be as specified in table ii herein. 4.4.2.1 additional criteria for device class m . steady - state life test conditions, method 1005 of mil- std -883: a. test condition a, b, c, or d . the test circuit shall be maintained by the manufacturer under document rev ision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 o f mil - std -883. b. t a = +125
standard microcircuit drawing size a 5962- 95592 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 1 1 dscc form 2234 apr 97 4.4.3 group d inspection . the group d inspection end - point electrical parameters shall be as specified in table ii herein. 4.4.4 group e inspection . group e inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. end - point electrical parameters shall be as specified in table ii herein. b. for device classes q and v, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535 for the rha level being tested. for device class m, the devices shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535, appendix a for the rha level being tested . all device classes must meet the postirradiation end - point electrical parameter limits as defined in table i at t a = +25 -va and have agreed to this drawing. 6.6.2 approved sources of supply for device class m . approv ed sources of supply for class m are listed in mil - hdbk - 103. the vendors listed in mil - hdbk - 103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by dla land and maritime -va.
standard microcircuit drawing bulletin date: 13-06-13 approved sources of supply for smd 5962 -95592 are listed below for immediate acquisition information only and shall be added to mil - hdbk - 103 and qml- 38535 during the next revision. mil- hdbk -103 and qml - 38535 will be revised to include the addition or deletion of sources. the vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by dla land and maritime - va. this information bulletin is superseded by the next dated revision of mil - hdbk - 103 and qml-38535. dla land and maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mi l/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962- 9559201mea 24355 ad677td/883b 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. vendor cage vendor name number and address 24355 analog devices rt 1 industrial park po box 9106 norwood, ma 02062 point of contact: 804 woburn street w ilmington, ma 01887 - 3462 the information contained herein is disseminated for convenience only and the government assumes no liability whatsoever for any inaccuracies in the information bulletin.

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