SN74AHC1G132 single positive-nand gate with schmitt-trigger inputs scls355a may 1997 revised june 1997 1 post office box 655303 ? dallas, texas 75265 operating range 2-v to 5.5-v v cc epic ? (enhanced-performance implanted cmos) process operation from very slow input transitions temperature-compensated threshold levels high noise immunity same pinout as sn74ahc1g00 packaged in plastic small-outline transistor package description the SN74AHC1G132 is a single nand gate, but because of the schmitt action, it has different input threshold levels for positive- and negative-going signals. this device performs the boolean function y = a ? b or y = a + b in positive logic. these circuits are temperature compensated and can be triggered from the slowest of input ramps and still give clean jitter-free output signals. the SN74AHC1G132 is characterized for operation from 40 c to 85 c. function table inputs output a b output y h h l l xh x l h logic symbol 2 1 a 2 b y 4 2 this symbol is in accordance with ansi/ieee std 91-1984 and iec publication 617-12. & product preview copyright ? 1997, texas instruments incorporated product preview information concerns products in the formative or design phase of development. characteristic data and other specifications are design goals. texas instruments reserves the right to change or discontinue these products without notice. please be aware that an important notice concerning availability, standard warranty, and use in critical applications of texas instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. epic is a trademark of texas instruments incorporated. dbv package (top view) 1 2 3 5 4 a b gnd v cc y
SN74AHC1G132 single positive-nand gate with schmitt-trigger inputs scls355a may 1997 revised june 1997 2 post office box 655303 ? dallas, texas 75265 logic diagram (positive logic) a b y absolute maximum ratings over operating free-air temperature range (unless otherwise noted) 2 supply voltage range, v cc 0.5 v to 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . input voltage range, v i (see note 1) 0.5 v to 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . output voltage range, v o (see note 1) 0.5 v to v cc + 0.5 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . input clamp current, i ik (v i < 0) 20 ma . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . output clamp current, i ok (v o < 0 or v o > v cc ) 20 ma . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . continuous output current, i o (v o = 0 to v cc ) 25 ma . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . continuous current through v cc or gnd 50 ma . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . package thermal impedance, q ja (see note 2) 347 c/w . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . storage temperature range, t stg 65 c to 150 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 stresses beyond those listed under aabsolute maximum ratingso may cause permanent damage to the device. these are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. notes: 1. the input and output voltage ratings may be exceeded if the input and output current ratings are observed. 2. the package thermal impedance is calculated in accordance with jesd 51. recommended operating conditions (see note 3) min max unit v cc supply voltage 2 5.5 v v i input voltage 0 5.5 v v o output voltage 0 v cc v i hi h l l v cc = 2 v 50 a i oh high-level output current v cc = 3.3 v 0.3 v 4 ma oh gp v cc = 5 v 0.5 v 8 m a i lll v cc = 2 v 50 a i ol low-level output current v cc = 3.3 v 0.3 v 4 ma ol p v cc = 5 v 0.5 v 8 m a t a operating free-air temperature 40 85 c note 3: unused inputs must be held high or low to prevent them from floating. product preview
SN74AHC1G132 single positive-nand gate with schmitt-trigger inputs scls355a may 1997 revised june 1997 3 post office box 655303 ? dallas, texas 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) parameter test conditions v cc t a = 25 c min max unit parameter test conditions v cc min typ max min max unit v 3 v 2.2 2.2 v v t+ positive - going input threshold voltage 4.5 v 3.15 3.15 v positive - going input threshold voltage 5.5 v 3.85 3.85 v 3 v 0.9 0.9 v v t negative - going input threshold voltage 4.5 v 1.35 1.35 v negative - going input threshold voltage 5.5 v 1.65 1.65 d v 3 v 0.3 1.2 0.3 1.2 v d v t hysteresis (v t+ v t ) 4.5 v 0.4 1.4 0.4 1.4 v hysteresis (v t + v t ) 5.5 v 0.5 1.6 0.5 1.6 v i50a 2 v 1.9 2 1.9 v v i oh = 50 a 3 v 2.9 3 2.9 v v oh oh 4.5 v 4.4 4.5 4.4 v oh i oh = 4 ma 3 v 2.58 2.48 i oh = 8 ma 4.5 v 3.94 3.8 v i50a 2 v 0.1 0.1 v v i ol = 50 a 3 v 0.1 0.1 v v ol ol 4.5 v 0.1 0.1 v ol i ol = 4 ma 3 v 0.36 0.44 i ol = 8 ma 4.5 v 0.36 0.44 i i v i = v cc or gnd 5.5 v 0.1 1 a i cc v i = v cc or gnd, i o = 0 5.5 v 1 10 a c i v i = v cc or gnd 5 v 2 10 10 pf switching characteristics over recommended operating free-air temperature range, v cc = 3.3 v 0.3 v (unless otherwise noted) (see figure 1) parameter from to load t a = 25 c min max unit parameter from (input) to (output) load capacitance min typ max min max unit t plh aorb y c l =15pf 5.5 7.9 1 9.5 ns t phl a or b y c l = 15 p f 5.5 7.9 1 9.5 ns t plh aorb y c l =50pf 8 11.4 1 13 ns t phl a or b y c l = 50 p f 8 11.4 1 13 ns switching characteristics over recommended operating free-air temperature range, v cc = 5 v 0.5 v (unless otherwise noted) (see figure 1) parameter from to load t a = 25 c min max unit parameter from (input) to (output) load capacitance min typ max min max unit t plh aorb y c l =15pf 3.7 5.5 1 6.5 ns t phl a or b y c l = 15 p f 3.7 5.5 1 6.5 ns t plh aorb y c l =50pf 5.2 7.5 1 8.5 ns t phl a or b y c l = 50 p f 5.2 7.5 1 8.5 ns product preview
SN74AHC1G132 single positive-nand gate with schmitt-trigger inputs scls355a may 1997 revised june 1997 4 post office box 655303 ? dallas, texas 75265 operating characteristics, v cc = 5 v, t a = 25 c parameter test conditions typ unit c pd power dissipation capacitance no load, f = 1 mhz pf parameter measurement information load circuit t plh t phl t phl t plh v oh v oh v ol v ol v cc 0 v input (see note b) out-of-phase output in-phase output voltage waveforms delay times test point c l (see note a) from output under test 50% v cc 50% v cc 50% v cc notes: a. c l includes probe and jig capacitance. b. input pulses are supplied by generators having the following characteristics: prr 1 mhz, z o = 50 w , t r = 3 ns, t f = 3 ns. c. the output is measured with one input transition per measurement. 50% v cc 50% v cc 50% v cc figure 1. load circuit and voltage waveforms product preview
important notice texas instruments (ti) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current. ti warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with ti's standard warranty. testing and other quality control techniques are utilized to the extent ti deems necessary to support this warranty. specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage (acritical applicationso). ti semiconductor products are not designed, intended, authorized, or warranted to be suitable for use in life-support applications, devices or systems or other critical applications. inclusion of ti products in such applications is understood to be fully at the risk of the customer. use of ti products in such applications requires the written approval of an appropriate ti officer. questions concerning potential risk applications should be directed to ti through a local sc sales office. in order to minimize risks associated with the customer's applications, adequate design and operating safeguards should be provided by the customer to minimize inherent or procedural hazards. ti assumes no liability for applications assistance, customer product design, software performance, or infringement of patents or services described herein. nor does ti warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of ti covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. copyright ? 1996, texas instruments incorporated
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