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IKP01N120H2 HighSpeed 2-Technology with soft, fast recovery anti-parallel EmCon HE diode C * Designed for: - SMPS - Lamp Ballast - ZVS-Converter - optimised for soft-switching / resonant topologies 2 generation HighSpeed-Technology for 1200V applications offers: - loss reduction in resonant circuits - temperature stable behavior - parallel switching capability - tight parameter distribution - Eoff optimized for IC =1A Pb-free lead plating; RoHS compliant 2 Qualified according to JEDEC for target applications Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/ VCE 1200V IC 1A Eoff 0.09mJ Tj 150C Marking K01H1202 Package PG-TO-220-3-1 nd G E * PG-TO-220-3-1 * * * Type IKP01N120H2 Maximum Ratings Parameter Symbol VCE IC Value 1200 3.2 1.3 Unit V A Collector-emitter voltage Triangular collector current TC = 25C, f = 140kHz TC = 100C, f = 140kHz Pulsed collector current, tp limited by Tjmax Turn off safe operating area VCE 1200V, Tj 150C Diode forward current TC = 25C TC = 100C Gate-emitter voltage Power dissipation TC = 25C Operating junction and storage temperature Soldering temperature, 1.6mm (0.063 in.) from case for 10s ICpul s IF 3.5 3.5 3.2 1.3 VGE Ptot Tj , Tstg 20 28 -40...+150 260 V W C 2 J-STD-020 and JESD-022 1 Rev. 2.3 May 06 Power Semiconductors IKP01N120H2 Thermal Resistance Parameter Characteristic IGBT thermal resistance, junction - case Diode thermal resistance, Junction - case Thermal resistance, junction - ambient Electrical Characteristic, at Tj = 25 C, unless otherwise specified Parameter Static Characteristic Collector-emitter breakdown voltage Collector-emitter saturation voltage V ( B R ) C E S V G E = 0V , I C = 3 00 A VCE(sat) V G E = 15 V , I C = 1 A T j =2 5 C T j =1 5 0 C V G E = 10 V , I C = 1 A, T j =2 5 C Gate-emitter threshold voltage Zero gate voltage collector current VGE(th) ICES I C = 30 A , V C E = V G E V C E = 12 0 0V , V G E = 0V T j =2 5 C T j =1 5 0 C Diode forward voltage VF V G E = 0, I F = 0 .5 A T j =2 5 C T j =1 5 0 C Gate-emitter leakage current Transconductance Dynamic Characteristic Input capacitance Output capacitance Reverse transfer capacitance Gate charge Internal emitter inductance measured 5mm (0.197 in.) from case Ciss Coss Crss QGate LE V C E = 25 V , V G E = 0V , f= 1 MH z V C C = 96 0 V, I C =1 A V G E = 15 V 7 nH 91.6 9.8 3.4 8.6 nC pF IGES gfs V C E = 0V , V G E =2 0 V V C E = 20 V , I C = 1 A 2.0 1.75 0.75 2.5 40 nA S 20 80 V 2.1 2.2 2.5 2.4 3 2.8 3.9 A 1200 V Symbol Conditions Value min. Typ. max. Unit RthJA PG-TO-220-3-1 62 RthJCD 11 RthJC 4.5 K/W Symbol Conditions Max. Value Unit Power Semiconductors 2 Rev. 2.3 May 06 IKP01N120H2 Switching Characteristic, Inductive Load, at Tj=25 C Parameter IGBT Characteristic Turn-on delay time Rise time Turn-off delay time Fall time Turn-on energy Turn-off energy Total switching energy td(on) tr td(off) tf Eon Eoff Ets T j =2 5 C , V C C = 80 0 V, I C = 1 A, V G E = 15 V /0 V , R G = 24 1 , 2) L =1 8 0n H, 2) C = 4 0p F Energy losses include 3) "tail" and diode reverse recovery. T j =2 5 C , V R = 8 00 V , I F = 1 A, R G = 24 1 13 6.3 370 28 0.08 0.06 0.14 mJ ns Symbol Conditions Value min. Typ. max. Unit Anti-Parallel Diode Characteristic Diode reverse recovery time Diode reverse recovery charge Diode peak reverse recovery current Diode current slope Diode peak rate of fall of reverse recovery current during t b trr Qrr Irrm diF/dt d i r r /d t 83 89 2.5 289 178 ns C A A/s Switching Characteristic, Inductive Load, at Tj=150 C Parameter IGBT Characteristic Turn-on delay time Rise time Turn-off delay time Fall time Turn-on energy Turn-off energy Total switching energy td(on) tr td(off) tf Eon Eoff Ets T j =1 5 0 C V C C = 80 0 V, I C = 1 A, V G E = 15 V /0 V , R G = 24 1 , 2) L =1 8 0n H, 2) C = 4 0p F Energy losses include 3) "tail" and diode reverse recovery. T j =1 5 0 C V R = 8 00 V , I F = 1 A, R G = 24 1 12 8.9 450 43 0.11 0.09 0.2 mJ ns Symbol Conditions Value min. Typ. max. Unit Anti-Parallel Diode Characteristic Diode reverse recovery time Diode reverse recovery charge Diode peak reverse recovery current Diode current slope Diode peak rate of fall of reverse recovery current during t b trr Qrr Irrm diF/dt d i r r /d t 213 180 2.7 240 135 ns C A A/s 2) 3) Leakage inductance L and stray capacity C due to dynamic test circuit in figure E Commutation diode from device IKP01N120H2 3 Rev. 2.3 May 06 Power Semiconductors IKP01N120H2 Switching Energy ZVT, Inductive Load Parameter IGBT Characteristic Turn-off energy Eoff V C C = 80 0 V, I C = 1 A, V G E = 15 V /0 V , R G = 24 1 , C r =1 nF T j =2 5 C T j =1 5 0 C 0.02 0.044 2) Symbol Conditions Value min. typ. max. Unit mJ Power Semiconductors 4 Rev. 2.3 May 06 IKP01N120H2 5A 10A Ic IC, COLLECTOR CURRENT 1A t p =1s 4A 2s 5s IC, COLLECTOR CURRENT 3A TC=80C 2A TC=110C 20s 0,1A 50s 1A Ic 100Hz 1kHz 10kHz 100kHz 200s ,01A DC 1V 10V 100V 1000V 0A 10Hz f, SWITCHING FREQUENCY Figure 1. Collector current as a function of switching frequency (Tj 150C, D = 0.5, VCE = 800V, VGE = +15V/0V, RG = 241) VCE, COLLECTOR-EMITTER VOLTAGE Figure 2. Safe operating area (D = 0, TC = 25C, Tj 150C) 30W 4A 25W 20W 15W IC, COLLECTOR CURRENT Ptot, POWER DISSIPATION 3A 2A 10W 1A 5W 0W 25C 50C 75C 100C 125C 150C 0A 25C 50C 75C 100C 125C 150C TC, CASE TEMPERATURE Figure 3. Power dissipation as a function of case temperature (Tj 150C) TC, CASE TEMPERATURE Figure 4. Collector current as a function of case temperature (VGE 15V, Tj 150C) Power Semiconductors 5 Rev. 2.3 May 06 IKP01N120H2 5A 5A 4A 4A IC, COLLECTOR CURRENT IC, COLLECTOR CURRENT VGE=15V 3A 12V 10V 8V 6V VGE=15V 3A 12V 10V 8V 6V 2A 2A 1A 1A 0A 0V 1V 2V 3V 4V 5V 0A 0V 1V 2V 3V 4V 5V 6V VCE, COLLECTOR-EMITTER VOLTAGE Figure 5. Typical output characteristics (Tj = 25C) VCE, COLLECTOR-EMITTER VOLTAGE Figure 6. Typical output characteristics (Tj = 150C) VCE(sat), COLLECTOR-EMITTER SATURATION VOLTAGE 5A 4V 4A Tj=+150C Tj=+25C IC, COLLECTOR CURRENT 3V IC=2A 3A IC=1A 2V IC=0.5A 1V 2A 1A 0A 3V 5V 7V 9V 0V -50C 0C 50C 100C 150C VGE, GATE-EMITTER VOLTAGE Figure 7. Typical transfer characteristics (VCE = 20V) Tj, JUNCTION TEMPERATURE Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature (VGE = 15V) Power Semiconductors 6 Rev. 2.3 May 06 IKP01N120H2 1000ns td(off) td(off) 100ns t, SWITCHING TIMES t, SWITCHING TIMES 100ns tf tf 10ns td(on) td(on) 10ns tr 0A 1A 2A tr 1ns 50 100 150 200 IC, COLLECTOR CURRENT Figure 9. Typical switching times as a function of collector current (inductive load, Tj = 150C, VCE = 800V, VGE = +15V/0V, RG = 241, dynamic test circuit in Fig.E) RG, GATE RESISTOR Figure 10. Typical switching times as a function of gate resistor (inductive load, Tj = 150C, VCE = 800V, VGE = +15V/0V, IC = 1A, dynamic test circuit in Fig.E) 6V td(off) VGE(th), GATE-EMITTER THRESHOLD VOLTAGE 5V t, SWITCHING TIMES 100ns 4V tf 3V max. typ. min. 2V td(on) 10ns tr 50C 100C 150C 1V 0C 0V -50C 0C 50C 100C 150C Tj, JUNCTION TEMPERATURE Figure 11. Typical switching times as a function of junction temperature (inductive load, VCE = 800V, VGE = +15V/0V, IC = 1A, RG = 241, dynamic test circuit in Fig.E) Tj, JUNCTION TEMPERATURE Figure 12. Gate-emitter threshold voltage as a function of junction temperature (IC = 0.03mA) Power Semiconductors 7 Rev. 2.3 May 06 IKP01N120H2 0.6mJ 1 ) Eon and Ets include losses due to diode recovery. 0.25mJ Ets 1 1 ) Eon and Ets include losses due to diode recovery. Ets 1 E, SWITCHING ENERGY LOSSES E, SWITCHING ENERGY LOSSES 0.20mJ 0.4mJ Eoff 0.15mJ Eon 0.10mJ 1 Eon 0.2mJ 1 0.0mJ 0A 1A 2A 3A Eoff 0.05mJ 50 100 150 200 IC, COLLECTOR CURRENT Figure 13. Typical switching energy losses as a function of collector current (inductive load, Tj = 150C, VCE = 800V, VGE = +15V/0V, RG = 241, dynamic test circuit in Fig.E ) RG, GATE RESISTOR Figure 14. Typical switching energy losses as a function of gate resistor (inductive load, Tj = 150C, VCE = 800V, VGE = +15V/0V, IC = 1A, dynamic test circuit in Fig.E ) 0.25mJ 1 E, SWITCHING ENERGY LOSSES 0.20mJ Ets 1 Eoff, TURN OFF SWITCHING ENERGY LOSS ) Eon and Ets include losses due to diode recovery. 0.06mJ IC=1A, TJ=150C 0.04mJ IC=1A, TJ=25C IC=0.3A, TJ=150C 0.02mJ 0.15mJ 1 0.10mJ Eon 0.05mJ Eoff IC=0.3A, TJ=25C 0.00mJ 0V/us 0.00mJ -40C 25C 100C 150C 1000V/us 2000V/us 3000V/us Tj, JUNCTION TEMPERATURE Figure 15. Typical switching energy losses as a function of junction temperature (inductive load, VCE = 800V, VGE = +15V/0V, IC = 1A, RG = 241, dynamic test circuit in Fig.E ) dv/dt, VOLTAGE SLOPE Figure 16. Typical turn off switching energy loss for soft switching (dynamic test circuit in Fig. E) Power Semiconductors 8 Rev. 2.3 May 06 IKP01N120H2 20V D=0.5 ZthJC, TRANSIENT THERMAL IMPEDANCE 0.1 0.05 0.02 10 K/W 0.01 -1 R,(K/W) 2.5069 1.1603 0.8327 R1 , (s) 0.00066 0.00021 0.00426 R2 VGE, GATE-EMITTER VOLTAGE 10 K/W 0 0.2 15V UCE=240V 10V UCE=960V 5V single pulse 10 K/W 1s -2 C 1 = 1 / R 1 C 2 = 2 /R 2 10s 100s 1ms 10ms 100ms 0V 0nC 5nC 10nC 15nC tp, PULSE WIDTH Figure 17. IGBT transient thermal impedance as a function of pulse width (D = tp / T) QGE, GATE CHARGE Figure 18. Typical gate charge (IC = 1A) 1000V 1.0A VCE, COLLECTOR-EMITTER VOLTAGE 100pF Ciss 800V 600V 0.6A 400V 0.4A 10pF Coss 0.2A 200V 0.0A 0V 0.0 0.2 0.4 0.6 0.8 1.0 1.2 Crss 0V 10V 20V 30V VCE, COLLECTOR-EMITTER VOLTAGE Figure 19. Typical capacitance as a function of collector-emitter voltage (VGE = 0V, f = 1MHz) tp, PULSE WIDTH Figure 20. Typical turn off behavior, hard switching (VGE=15/0V, RG=220, Tj = 150C, Dynamic test circuit in Figure E) Power Semiconductors 9 Rev. 2.3 May 06 ICE COLLECTOR CURRENT 0.8A C, CAPACITANCE IKP01N120H2 1000V ZthJC, TRANSIENT THERMAL RESISTANCE 1.0A VCE, COLLECTOR-EMITTER VOLTAGE 10 K/W D=0.5 1 800V ICE COLLECTOR CURRENT 0.8A 600V 0.6A 0.2 0.1 0 R,(K/W) 3.668 6.401 0.81 0.05 0.02 0.01 single pulse R1 , (s) 9.29E-04 2.14E-04 4.81E-03 R2 400V 0.4A 10 K/W C1=1/R 1 C 2= 2/R 2 0.2A 200V 0.0A 0V 0.0 0.4 0.8 1.2 1.6 2.0 10s 100s 1ms 10ms tp, PULSE WIDTH Figure 21. Typical turn off behavior, soft switching (VGE=15/0V, RG=220, Tj = 150C, Dynamic test circuit in Figure E) tP, PULSE WIDTH Figure 22. Diode transient thermal impedance as a function of pulse width (D=tP/T) 200uC 210ns trr, REVERSE RECOVERY TIME 180ns TJ=150C Qrr, REVERSE RECOVERY CHARGE 180uC TJ=150C 160uC 150ns 120ns 140uC 90ns TJ=25C 120uC 60ns 100uC TJ=25C 30ns 100Ohm 200Ohm 300Ohm 80uC 100Ohm 200Ohm 300Ohm RG, GATE RESISTANCE Figure 23. Typical reverse recovery time as a function of diode current slope VR=800V, IF=3A, Dynamic test circuit in Figure E) RG, GATE RESISTANCE Figure 24. Typical reverse recovery charge as a function of diode current slope (VR=800V, IF=3A, Dynamic test circuit in Figure E) Power Semiconductors 10 Rev. 2.3 May 06 IKP01N120H2 4.0A -140A/us 3.5A dirr/dt, DIODE PEAK RATE OF FALL OF REVERSE RECOVERY CURRENT Irr, REVERSE RECOVERY CURRENT TJ=150C T J =150C 3.0A -160A/us -180A/us T J =25C 2.5A -200A/us TJ=25C 100O hm 200O hm 300O hm 100Ohm 200Ohm 300Ohm RG, GATE RESISTANCE Figure 25. Typical reverse recovery current as a function of diode current slope (VR=800V, IF=3A, Dynamic test circuit in Figure E) 3.0V RG, GATE RESISTANCE Figure 26. Typical diode peak rate of fall of reverse recovery current as a function of diode current slope (VR=800V, IF=3A, Dynamic test circuit in Figure E) IF=1A 4A T J =150C 2.5V VF, FORWARD VOLTAGE IF, FORWARD CURRENT IF=0.5A 2.0V IF=0.25A 2A T J =25C 1.5V 0A 0V 1.0V 1V 2V 3V 4V 5V -50C 0C 50C 100C 150C VF, FORWARD VOLTAGE Figure 27. Typical diode forward current as a function of forward voltage TJ, JUNCTION TEMPERATURE Figure 28. Typical diode forward voltage as a function of junction temperature Power Semiconductors 11 Rev. 2.3 May 06 IKP01N120H2 TO-220AB PG-TO220-3-1 symbol dimensions [mm] min A B C D E F G H K L M N P T 9.70 14.88 0.65 3.55 2.60 6.00 13.00 4.35 0.38 0.95 max 10.30 15.95 0.86 3.89 3.00 6.80 14.00 4.75 0.65 1.32 min 0.3819 0.5858 0.0256 0.1398 0.1024 0.2362 0.5118 0.1713 0.0150 0.0374 [inch] max 0.4055 0.6280 0.0339 0.1531 0.1181 0.2677 0.5512 0.1870 0.0256 0.0520 2.54 typ. 4.30 1.17 2.30 4.50 1.40 2.72 0.1 typ. 0.1693 0.0461 0.0906 0.1772 0.0551 0.1071 Power Semiconductors 12 Rev. 2.3 May 06 IKP01N120H2 i,v diF /dt tr r =tS +tF Qr r =QS +QF IF tS QS tr r tF 10% Ir r m t VR Ir r m QF dir r /dt 90% Ir r m Figure C. Definition of diodes switching characteristics 1 Tj (t) p(t) r1 r2 2 n rn r1 r2 rn Figure A. Definition of switching times TC Figure D. Thermal equivalent circuit 1/2 L oo DUT (Diode) VDC RG DUT (IGBT) L C Cr 1/2 L Figure E. Dynamic test circuit Leakage inductance L = 180nH, Stray capacitor C = 40pF, Relief capacitor Cr = 1nF (only for ZVT switching) Figure B. Definition of switching losses Power Semiconductors 13 Rev. 2.3 May 06 IKP01N120H2 Edition 2006-01 Published by Infineon Technologies AG 81726 Munchen, Germany (c) Infineon Technologies AG 5/18/06. All Rights Reserved. Attention please! The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics ("Beschaffenheitsgarantie"). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Power Semiconductors 14 Rev. 2.3 May 06 |
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