| PART |
Description |
Maker |
| AEAT-7000 |
The following cumulative test results
Reliability Datasheet
|
AVAGO TECHNOLOGIES LIMI...
Broadcom Corporation.
|
| 525108 |
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools
|
TE Connectivity Ltd
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| 1752680-6 1752681-3 |
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
|
Tyco Electronics
|
| 21045--6 525108 21028--4 5--21028--7 |
Cumulative Trauma Disorders can result from the prolonged use ofmanually powered hand tools.
|
TE Connectivity Ltd
|
| AP160L AP160 |
8-BIT MICROCONTROLLER WITH 8KB OTP
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
Zener Diode; Zener Voltage Typ, Vz:5.1V; Vz Test Current, Izt:20mA; Power Dissipation, Pd:500mW; Package/Case:41-MiniDIP; Leaded Process Compatible
|
AMIC Technology Corporation
|
| HCTS393MS HCTS393KMSR HCTS393K HCTS393HMSR HCTS393 |
Radiation Hardened Dual 4-Input NOR Gate
Test Bus Controllers 68-CPGA -55 to 125
Test Bus Controllers 68-CFP -55 to 125
Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
Radiation Hardened Dual 4-Stage Binary Counter
From old datasheet system
|
INTERSIL[Intersil Corporation]
|
| BCM1510TRP BCM1500TRP |
CALISTO™ Test and Reference Platform
CALISTO TEST AND REFERENCE PLATFORM
|
BOARDCOM[Broadcom Corporation.]
|
| 44242-0001 44242-0002 44242-0003 44242-0004 44242- |
Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact
Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
|
Molex Electronics Ltd.
|
