| PART |
Description |
Maker |
| 24A34-1 24A34-2 24A34-14 24A34-15 24A34-3 24A34-4 |
FAILURE TO READ AND FOLLOW ALL INSTRUCTIONS CAREFULLY BEFORE
|
List of Unclassifed Manufacturers
List of Unclassifed Man...
|
| TDA5153AG TDA5153BG TDA5153X |
Pre-amplifier for Hard Disk Drive HDD with MR-read/inductive write heads 预硬盘驱动器硬盘驱动器放大器MR-read/inductive写磁
|
NXP Semiconductors N.V.
|
| 500102D 500102D-15 |
HEC Error Insertion Failure
Errata
|
M/A-COM Technology Solutions, Inc.
M/A-COM Technology Solution...
|
| AMIS-70020 |
Power Failure Elapsed Time Counter
|
AMI[AMI SEMICONDUCTOR]
|
| AN565 |
MEDIAN-TIME-TO-FAILURE (MTF) OF A L-BAND POWER TRANSISTOR UNDER RF CONDITIONS
|
SGS Thomson Microelectronics
|
| T540D156M035AH6610 |
Capacitor, Tantalum, 15 uF, 7343, /-20% Tol, 35 VDC (85C), Failure Rate=A
|
Kemet Corporation
|
| T543B476M010ATW070 |
Capacitor, Tantalum, 47 uF, 3528, /-20% Tol, 10 VDC (105C), Failure Rate=A
|
Kemet Corporation
|
| T540D107M016AH6710 |
Capacitor, Tantalum, 100 uF, 7343, /-20% Tol, 16 VDC (85C), Failure Rate=A
|
Kemet Corporation
|
| SSI32R2020R-4CL SSI32R2020R-4CV SSI32R2020R-6CV SS |
6-Channel Read/Write Circuit
4-Channel Disk/Tape Read/Write Circuit 4通道的磁磁带写电
10-Channel Disk Read/Write Circuit 10通道磁盘写电
2-Channel Disk Read/Write Circuit 2通道磁盘写电
|
DB Lectro, Inc.
Lattice Semiconductor, Corp.
Samsung Semiconductor Co., Ltd.
|
| 87C576 P87C576EBAA P87C576EBBB P87C576EFAA P87C576 |
80C51 8-bit microcontroller family 8K/256 OTP/ROM, 6 channel 10-bit A/D, 4 comparators, failure detect circuitry, watchdog timer
80C51 8-bit microcontroller family 8K/256 OTP/ROM/ 6 channel 10-bit A/D/ 4 comparators/ failure detect circuitry/ watchdog timer
|
NXP Semiconductors
Philips Semiconductors
|
| XR-511R-4D XR-511-6CP XR-511-6CJ XR-511-6D XR-511R |
4-Channel Disk/Tape Read/Write Circuit
8-Channel Disk Read/Write Circuit 8通道磁盘写电
6-Channel Read/Write Circuit 6通道写电
|
Linear Technology, Corp.
|
| ERC |
Military/Established Reliability, MIL-R-55182 Qualified, Type RNC, Very Low Noise, Verified Failure Rate, 100% Stabilization and Screening Tests, Controlled Temperature Coefficient
|
Vishay
|
