| PART |
Description |
Maker |
| RDHA710SE10A2F |
Neutron Test Report
|
International Rectifier
|
| TRIMMING-POTENTIOMETER |
SGS Test Report
|
Kingtronics International Company
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Laboratories
|
| TR636E-10164 |
QUALITY EVALUATION TEST REPORT IT3-25H
|
Hirose Electric
|
| TR636E-10163 |
QUALITY EVALUATION TEST REPORT IT3-15H
|
Hirose Electric
|
| AD9618TQ AD9618JN AD9618SQ AD9618AQ AD9618 AD9618B |
Low Distortion, Precision, Wide Bandwidth Op Amp OP-AMP, 1100 uV OFFSET-MAX, 8000 MHz BAND WIDTH, CDIP8
Low Distortion/ Precision/ Wide Bandwidth Op Amp
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
|
Analog Devices, Inc.
AD[Analog Devices]
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| BF995B BF995A BF995 |
ECONOLINE: RKZ - Safety standards and approvals: EN 60950 certified, rated for 250VAC (LVD test report)- Custom Solutions Available- 3kVDC & 4kVDC Isolation- UL94V-0 Package Material- Power Sharing on Output- Efficiency to 84%
N-Channel Dual Gate MOS-Fieldeffect Tetrode, Depletion Mode
From old datasheet system
N-Channel Dual Gate MOS-Fieldeffect Tetrode/ Depletion Mode
|
Vishay Intertechnology,Inc.
VISAY[Vishay Siliconix]
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
