| PART |
Description |
Maker |
| U3665M U3665M-MDP U3665M-MFP |
SPECIALTY CONSUMER CIRCUIT, PDIP16
Baseband Delay Line 64 us (Improved Version)
Baseband Delay Line 0.064 ms (Improved Version)
|
TEMIC[TEMIC Semiconductors]
|
| EE13-K-H-8P-SW EE13-KH-8P-SW |
BOBBIN MATERIAL: PHENOLIC PIN MATERIAL: CP WIRE UL REC. UL 94V-0
|
FERYSTER Inductive Components Manufacturer
FERYSTER Inductive Comp...
|
| EE13-K-V-10P-SW EE13-KV-10P-SW |
BOBBIN MATERIAL: PHENOLIC PIN MATERIAL: CP WIRE UL REC. UL 94V-0
|
FERYSTER Inductive Components Manufacturer
FERYSTER Inductive Comp...
|
| MX7524UQ/883B |
Improved MX7524
|
MAXIM - Dallas Semiconductor
|
| AN5177 |
Improved Gate Driver
|
Dynex
|
| TS6001BIG325 TS6001BIG325T TS6001AIG325 |
Improved Electrical Performance
|
Silicon Laboratories
|
| DG409CY DG408AK DG408C_D DG408CJ DG408CY DG408DJ D |
iMPROVED / 8-cHANNEL/dUAL 4-cHANNEL / cmos aNALOG mULTIPLEXERS
iMPROVED, 8-cHANNEL/dUAL 4-cHANNEL, cmos aNALOG mULTIPLEXERS DUAL 4-CHANNEL, DIFFERENTIAL MULTIPLEXER, UUC18
|
MAXIM - Dallas Semiconductor
Maxim Integrated Products, Inc.
|
| L6599AT L6599ATD L6599ATDTR |
Improved high voltage resonant controller
|
STMicroelectronics
|
| AN1227 |
IMPROVED RF MOSFET RELIABILITY THROUGH PACKAGING ENHANCEMENTS
|
SGS Thomson Microelectronics
|
| SAA4978 SAA4978H |
Picture Improved Combined Network PICNIC
|
NXP Semiconductors
|
| NPSS25 |
Improved glass passivation for high reliability
|
Naina Semiconductor ltd.
|
| NPIS40 |
Improved glass passivation for high reliability
|
Naina Semiconductor ltd.
|
