| PART |
Description |
Maker |
| GET-BC-0006 |
Qualification Test Results on Si MMIC
|
California Eastern Laboratories
|
| GET-30497 |
Qualification Test Results on Si MMIC 资质测试结果对硅单片
|
California Eastern Laboratories, Inc.
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
California Eastern Laboratories
|
| AT25F512A |
SPI EEPROM PRODUCT QUALIFICATION
|
ATMEL Corporation
|
| SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc.
Stanford Microdevices
|
| IRFB16N50K SIHFB16N50K SIHFB16N50K-E3 IRFB16N50KPB |
Low Gate Charge Qg Results in Simple Drive Requirement
|
Kersemi Electronic Co., Ltd.
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| AS8221-ASSP |
FlexRay??Standard Transceiver; Package Type: SSOP-20; Temperature Range: -40 - 125 掳C; Automotive Qualification: X
|
Austriamicrosystems AG
|
| EFM32TG840F32-QFN64 EFM32TG232F8-QFP64 EFM32TG110F |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| EFM32TG210F8-QFN32 EFM32TG825F16-BGA48 EFM32TG108F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
