| PART |
Description |
Maker |
| 1-1461491-0 2-1461491-0 3-1461491-0 1461491-1 1-14 |
Qualification Test Report
|
Tyco Electronics
|
| SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc.
Stanford Microdevices
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| GET-BC-0006 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
CEL[California Eastern Labs]
|
| ISL6405ERZ-T ISL6367CRZ ISL6367CRZ-T ISL6367CRZ-TS |
PCN13024 ?ASECL Reliability Qualification Summary
|
Intersil Corporation
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
California Eastern Laboratories
|
| AT17LV65A AT17LV002A-10QI |
65/128/256/512K-bit and 1/2M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification pa
|
Atmel Corp
|
| MC9S12DJ64MFU MC9S12DJ64VFU 9S12D32DGV1 S12BDLCV1D |
MC9S12DJ64 Device User Guide V01.17 16-BIT, FLASH, 25 MHz, MICROCONTROLLER, PQFP80
9S12DGDJ64DGV1 Device Guide. also covers 9S12D64. 9S12A64. 9S12D32. and 9S12A32 devices 9S12DGDJ64DGV1设备指南。也包括9S12D649S12A649S12D32。和9S12A32设备
|
Motorola Mobility Holdings, Inc.
HIROSE ELECTRIC Co., Ltd.
Freescale Semiconductor, Inc
|
| W81386D |
PC & Peripheral IC > Peripheral Device IC > USB Device & Hub
From old datasheet system
|
Winbond
|
