| PART |
Description |
Maker |
| TLP3230 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
TOSHIBA[Toshiba Semiconductor]
|
| TLP3130 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3240 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
| TLP3215 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3214 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| AM29SL800B AM29SL800BB170EC AM29SL800BB170ECB AM29 |
High Speed CMOS Logic Octal Inverting Bus Transceiver with 3-State Outputs 20-CDIP -55 to 125
8-Bit Identity/Magnitude Comparators (P=Q) with Enable 20-CDIP -55 to 125
High Speed CMOS Logic Quad 2-Input EXCLUSIVE OR Gates 14-CDIP -55 to 125
4-Bit Magnitude Comparator 16-CDIP -55 to 125
High Speed CMOS Logic Dual Positive-Edge Trigger D Flip-Flops with Set and Reset 14-CDIP -55 to 125
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 200 ns, PBGA48
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 8兆位 M中的x 8-Bit/512亩x 16位）.8伏的CMOS只超低电压快闪记忆体
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 170 ns, PDSO48
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 200 ns, PDSO48
|
Advanced Micro Devices, Inc.
|
| 1760 |
WOODHEAD? TESTERS PERFORM BASIC-VERIFICATION AND MULTIFUNCTION WIRE TESTING WITH COMPACT, SIMPLE-TO-USE DEVICES THAT
|
Molex Electronics Ltd.
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
