| PART |
Description |
Maker |
| GET-30704 |
Qualification Test Results on Si MMIC
|
California Eastern Laboratories
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
California Eastern Laboratories
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| AEAT-7000 |
The following cumulative test results
Reliability Datasheet
|
AVAGO TECHNOLOGIES LIMI...
Broadcom Corporation.
|
| EFM32ZG222F4-QFP48T |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| EFM32WG995F128-BGA120 EFM32WG995F256-BGA120 EFM32W |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| IRLML6346TRPBF |
Industry-standard SOT-23 Package MSL1, Consumer Qualification Multi-vendor compatibility
|
TY Semiconductor Co., Ltd
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
| AT17LV65A AT17LV002A-10QI |
65/128/256/512K-bit and 1/2M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification pa
|
Atmel Corp
|
