| PART |
Description |
Maker |
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| V23815-S1306-M931 V23814-S1306-M931 |
Test Board PAROLI?Receiver AC/DC
Test Board PAROLI Transmitter AC/DC
|
Infineon
|
| 44281-0001 44281-0002 44281-0003 44281-0004 44281- |
Mini-Fit Test Plugs
Mini-Fit垄芒 Test Plugs
|
Molex Electronics Ltd.
|
| 16043A 16043B |
16043A 3-Terminal SMD Test Fixture
16043B 3-Terminal SMD Test Fixture
|
Agilent (Hewlett-Packard)
|
| TXS100ZA TXS100ZB TXS100ZY TXS75ZA TXS75ZB TXS75ZY |
Input voltage range 36ˇ75V DC Single 80ˇ100A output 1500V DC I/O electrical strength test voltage 输入电压范围3675V直流1500V的单80100A直流输出的I / O电气强度试验电压
Input voltage range 365V DC Single 8000A output 1500V DC I/O electrical strength test voltage
Input voltage range 36?5V DC Single 80?00A output 1500V DC I/O electrical strength test voltage
|
Power-One
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| MB6052USZ-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MB6022NSC-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
|
Knowles Electronics
|
| E40-2FT-KMKM |
Test Cable
|
Mini-Circuits
|
| TMP40-1M-KMKM |
Test Cable
|
Mini-Circuits
|
