| PART |
Description |
Maker |
| SCANPSC110FSC SCANPSC110F SCANPSC110FSCX |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support)
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
From old datasheet system
|
FAIRCHILD[Fairchild Semiconductor]
|
| EPM240 EPM570 EPM1270 EPM2210 |
(EPMxxxx) JTAG & In-System Programmability
|
Altera Corporation
|
| SCAN18373T SCAN1837TSSC SCAN18373TSSCX |
Transparent Latch with 3-STATE Outputs
Transparent Latch with 3-STATE Outputs; Package: SSOP; No of Pins: 56; Container: Tape & Reel SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO56
|
FAIRCHILD[Fairchild Semiconductor]
|
| AS91L1001 |
JTAG Test Controller
|
Alliance Semiconductor
|
| LT74CC16CL LT74CC32CL LT74CV16CL |
Test/JTAG Support
|
|
| EP3C5E144C8N |
Ability to disable external JTAG port
|
Altera Corporation
|
| AS91L1001S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test controller
|
Alliance Semiconductor
|
| INTERSILCORP-X9241AWSZT2 X9241AWSZT1 |
Quad Digital Controlled Potentionmeters (XDCP™), Non-Volatile/Low Power/2-Wire/64 Taps; Temperature Range: 0°C to 70°C; Package: 20-SOIC T&R
|
INTERSIL CORP
|
| AT94K05 AT94K10 AT94K40 AT94KAL |
5K - 40K Gates of AT40K FPGA with 8-bit Microcontroller, up to 36K Bytes of SRAM and On-chip JTAG ICE
|
ATMEL Corporation
|
| AT94K AT94K05AL-25AJC AT94K40AL-25DQC AT94K05AL-25 |
5K - 40K Gates of AT40K FPGA with 8-bit Microcontroller, up to 36K Bytes of SRAM and On-chip JTAG ICE
5K - 40K Gates of AT40K FPGA with 8-bit Microcontroller/ up to 36K Bytes of SRAM and On-chip JTAG ICE
|
Atmel Corp.
ATMEL Corporation
|
