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AS1347 BC557BBU 11020 MAX8973A MAX4549 TN7211PM HD4850 SFH303FA
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    R3710 R3710-16 R3710-CEAA-E1 R3710-CEAA-E1T

ON Semiconductor
Part No. R3710 R3710-16 R3710-CEAA-E1 R3710-CEAA-E1T
OCR Text ...& 4 voltage regulator m u x a/d pre bi q ua d filters agco volume control wideband gain control a/d post biquad filters 1 & 2 control (ms/digvc) environmental classification frequency ba n d synthesis data logging eeprom clock generator...
Description    preconfigured DSP System

File Size 146.84K  /  18 Page

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    IRHLNM73110SCS IRHLNM77110

International Rectifier
Part No. IRHLNM73110SCS IRHLNM77110
OCR Text ... 0.25 (typical) g pre-irradiation c a radiation hardened irhlnm77110logic level power m...post radiation.this is achieved while maintaining single event gate rupture and single event burnout...
Description 100V 100kRad Hi-Rel Single N-Channel TID Hardened MOSFET in a SMD 0.2 package

File Size 172.62K  /  9 Page

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    Atmel
Part No. MH1RT
OCR Text ...cking the netlist and estimated pre-route delay simulations. the following design systems are supported: table 1. list of available mh1rt...post-route rc data is extracted. following post-route verification and a final design review, so cal...
Description Rad Hard 1.6M Used Gates 0.35 m CMOS Sea of Gates / Embedded Gates

File Size 174.79K  /  20 Page

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    CD4023BMS CD4012BMS CD4011BMS FN3079 CD4023B CD4012 CD4023

INTERSIL[Intersil Corporation]
Part No. CD4023BMS CD4012BMS CD4011BMS FN3079 CD4023B CD4012 CD4023
OCR Text ...BOL IDD IOL5 IOH5A 0.1A 20% x pre-Test Reading 20% x pre-Test Reading DELTA LIMIT TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUP Initial Test (pre Burn-In) Interim Test 1 (post Burn-In) Interim Test 2 (post Burn-In) PDA (Note 1) Inte...
Description From old datasheet system
CMOS NAND Gates
NAND, 3-Input, Triple, Rad-Hard, CMOS, Logic
NAND, 2-Input, Quad, Rad-Hard, CMOS, Logic
NAND, 4-Input, Dual, Rad-Hard, CMOS, Logic

File Size 108.28K  /  9 Page

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    CD4503BMS FN3335 CD4503 CD4503BMSH6W CD4503BDMSR

INTERSIL[Intersil Corporation]
Part No. CD4503BMS FN3335 CD4503 CD4503BMSH6W CD4503BDMSR
OCR Text ...BOL IDD IOL5 IOH5A 0.2A 20% x pre-Test Reading 20% x pre-Test Reading DELTA LIMIT 4-4 CD4503BMS TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUP Initial Test (pre Burn-In) Interim Test 1 (post Burn-In) Interim Test 2 (post Burn-In)...
Description 4000/14000/40000 SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDIP16
From old datasheet system
CMOS Hex Buffer
Buffer/Driver

File Size 73.58K  /  8 Page

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    IRHLNJ797034SCS IRHLNJ793034SCS

International Rectifier
Part No. IRHLNJ797034SCS IRHLNJ793034SCS
OCR Text ... 1.0 (typical) g pre-irradiation c a radiation hardened irhlnj797034logic level power m...post radiation. this is achieved while maintaining single event gate rupture and single event burn...
Description -60V 100kRad Hi-Rel Single P-Channel TID Hardened MOSFET in a SMD-0.5 package

File Size 202.78K  /  9 Page

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    IRHN7450SE

IRF[International Rectifier]
Part No. IRHN7450SE
OCR Text previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1313A REPETITIVE AVALANCHE AND dv/dt RATED HEXFET(R) T...post-radiation test conditions, International Rectifier's RAD HARD HEXFETs retain identical electric...
Description TRANSISTOR N-CHANNEL(BVdss=500V, Rds(on)=0.51ohm, Id=12A)

File Size 80.82K  /  4 Page

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    IRHLNJ73034SCS IRHLNJ77034 IRHLNJ77034SCS

International Rectifier
Part No. IRHLNJ73034SCS IRHLNJ77034 IRHLNJ77034SCS
OCR Text ... 1.0 (typical) g pre-irradiation c a radiation hardened irhlnj77034logic level power ...post radiation.this is achieved while maintaining single event gate rupture and single event burnout...
Description 60V 100kRad Hi-Rel Single N-Channel TID Hardened MOSFET in a SMD-0.5 package

File Size 195.75K  /  9 Page

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