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AGERE[Agere Systems]
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| Part No. |
T8100
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| OCR Text |
...puts and TTL-compatible outputs boundary-scan testing support 208-pin, plastic SQFP package 217-pin BGA package (industrial temperature rang...SC[3:0] Pin 104 106 110 108 36--33 Type Name/Description I/O MVIP 4.096 MHz Clock. 8 mA drive, Schmi... |
| Description |
H.100/H.110 Interface and Time-Slot Interchanger
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| File Size |
1,439.07K /
92 Page |
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it Online |
Download Datasheet
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AGERE[Agere Systems]
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| Part No. |
TTSI2K32T3BAL TTSI2K32T
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| OCR Text |
...ocessor interface. IEEE 1149.1 boundary scan (JTAG). Test-pattern generation and checking for on-line system testing (PRBS, QRSS, or user-defined byte). User-accessible BIST for data and connection stores. 3.3 V power supply with 5 V toler... |
| Description |
2048-Channel, 32-Highway Time-Slot Interchanger
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| File Size |
816.71K /
66 Page |
View
it Online |
Download Datasheet
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AGERE[Agere Systems]
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| Part No. |
TTSI4K32T3BAL TTSI4K32T
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| OCR Text |
...ocessor interface. IEEE 1149.1 boundary scan (JTAG). Test-pattern generation and checking for on-line system testing (PRBS, QRSS, or user-defined byte). User-accessible BIST for data and connection stores. 3.3 V power supply with 5 V toler... |
| Description |
4096-Channel, 32-Highway Time-Slot Interchanger
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| File Size |
584.20K /
64 Page |
View
it Online |
Download Datasheet
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Price and Availability
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