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XILINX INC
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| Part No. |
XCR3064A-10CP56C
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| OCR Text |
... also provide a global 3-state (gts) pin, which, when enabled and pulled low, will 3-state all the outputs of the device. this pin is provided to support "in-circuit testing" or "bed-of-nails testing". there are two feedback paths to the z... |
| Description |
EE PLD, 10 ns, PBGA56
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| File Size |
158.77K /
17 Page |
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it Online |
Download Datasheet
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Xilinx
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| Part No. |
XCR5032C DS046
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| OCR Text |
... also provide a Global 3-State (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-Circuit Testing" or "Bed-of-Nails" testing. There are two feedback paths to the ZI... |
| Description |
with Enhanced Clocking
From old datasheet system
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| File Size |
194.58K /
17 Page |
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it Online |
Download Datasheet |
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Xilinx, Inc.
XILINX INC
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| Part No. |
XCR3064 DS036 XCR3064-12PC68I XCR3064-12PC84I XCR3064-10PC84C
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| OCR Text |
... also provide a Global 3-State (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-Circuit Testing" or "Bed-of-Nails" testing. There are two feedback paths to the ZI... |
| Description |
EE PLD, 10 ns, PQCC84
EE PLD, 12 ns, PQCC84
64 Macrocell CPLD(64瀹????????缂???昏??ㄤ欢)
EE PLD, 12 ns, PQCC68
From old datasheet system
Product Specification
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| File Size |
111.78K /
15 Page |
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it Online |
Download Datasheet |
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Xilinx
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| Part No. |
XCR3128A DS035
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| OCR Text |
... also provide a Global 3-state (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-Circuit Testing" or "Bed-of-Nails" testing. There are two feedback paths to the ZI... |
| Description |
Product Specification
From old datasheet system
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| File Size |
142.39K /
18 Page |
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it Online |
Download Datasheet |
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Xilinx
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| Part No. |
XCR3128 DS034
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| OCR Text |
... also provide a Global 3-state (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-circuit Testing" or "Bed-of-nails" testing. There are two feedback paths to the ZI... |
| Description |
Product Specification
From old datasheet system
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| File Size |
114.11K /
18 Page |
View
it Online |
Download Datasheet |
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Xilinx
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| Part No. |
XCR5064 DS043
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| OCR Text |
... also provide a Global 3-state (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-Circuit Testing" or "Bed-of-Nails Testing". There are two feedback paths to the ZI... |
| Description |
Product Specification
From old datasheet system
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| File Size |
250.17K /
14 Page |
View
it Online |
Download Datasheet |
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Xilinx
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| Part No. |
DS041 XCR5128
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| OCR Text |
... also provide a Global 3-State (gts) pin, which, when enabled and pulled Low, will 3-state all the outputs of the device. This pin is provided to support "In-Circuit Testing" or "Bed-of-Nails Testing". There are two feedback paths to the ZI... |
| Description |
From old datasheet system
Product Specification
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| File Size |
116.35K /
20 Page |
View
it Online |
Download Datasheet |
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Price and Availability
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