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Intersil
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| Part No. |
CMM5104 FN3406
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| OCR Text |
... >100 MEV-cm2/mg * Single Event upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) * Dose Rate Survivability: >1 x 1012 RAD (Si)/s * Dose Rate upset >1010 RAD (Si)/s 20ns Pulse * Latch-Up Free Under Any Conditions * Fully Static Operatio... |
| Description |
Radiation Hardened, High Reliability, CMOS/SOS 4096 Word by 1-Bit LSI Static RAM From old datasheet system
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| File Size |
41.53K /
10 Page |
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it Online |
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Intersil
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| Part No. |
HCTS00MS
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| OCR Text |
...100 mev-cm 2 /mg single event upset (seu) immunity < 2 x 10 -9 errors/bit-day (typ) dose rate survivability: >1 x 10 12 rad (si)/s dose rate upset >10 10 rad (si)/s 20ns pulse cosmic ray upset immunity < 2 x 10 -9 errors/gate da... |
| Description |
NAND-Gate, 2-Input, TTL Inputs, Quad, Rad-Hard, High-Speed, CMOS, Logic
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| File Size |
410.72K /
8 Page |
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it Online |
Download Datasheet
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Intersil
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| Part No. |
RFD16N05SM RFD16N05 FN2467
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| OCR Text |
... >100 MEV-cm2/mg * Single Event upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) * Dose Rate Survivability: >1 x 1012 RAD (Si)/s
* Dose Rate upset >1010 RAD (Si)/s 20ns Pulse * Cosmic Ray upset Rate 2 x 10-9 Errors/Bit Day (Typ) * L... |
| Description |
16A, 50V, 0.047 Ohm, N-Channel Power MOSFETs From old datasheet system
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| File Size |
178.92K /
10 Page |
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it Online |
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Honeywell
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| Part No. |
HLX6256
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| OCR Text |
... ? dynamic and static transient upset hardness through 1x10 9 rad(si)/s ? dose rate survivability through 1x10 11 rad(si)/s ? soft error rate of <1x10 -10 upsets/bit-day ? latchup free general description the 32k x 8 radiation hardened s... |
| Description |
32K x 8 STATIC RAM-Low Power SOI
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| File Size |
178.42K /
12 Page |
View
it Online |
Download Datasheet
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Price and Availability
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