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AEROFLEX[Aeroflex Circuit Technology]
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| Part No. |
5962R9563801VYX
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| OCR Text |
...oss-Section (1Kx8) Single Event upset Single Event Latchup1
Note: 1. Worst case temperature TA = +125C. 2. Adams 90% worst case environment (geosynchronous).
circuit density and reliability. For transient radiation hardness and latchup ... |
| Description |
Radiation-Hardened MicroController
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| File Size |
186.14K /
19 Page |
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it Online |
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INTERSIL[Intersil Corporation]
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| Part No. |
ACTS573MS 5962F9672501VXC 5962F9672501VRC FN4092 ACTS573D ACTS573HMSR ACTS573K
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| OCR Text |
.... >300K RAD (Si) * Single Event upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) * SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg * Dose Rate upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns... |
| Description |
Dual J-K Negative-Edge-Triggered Flip-Flop With Clear And Preset 16-PDIP 0 to 70
Radiation Hardened Octal Three-State Transparent Latch
From old datasheet system
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| File Size |
44.37K /
3 Page |
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it Online |
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INTERSIL[Intersil Corporation]
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| Part No. |
HCTS574MS FN2359 HCTS574D HCTS574DMSR HCTS574HMSR HCTS574K HCTS574KMSR
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| OCR Text |
...s: >100 MEV-cm2/mg Single Event upset (SEU) Immunity < 2 x 10-9 Errors/BitDay (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose Rate upset >1010 RAD (Si)/s 20ns Pulse Latch-Up Free Under Any Conditions Fanout (Over Temperature Range)... |
| Description |
From old datasheet system
Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered
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| File Size |
133.97K /
11 Page |
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it Online |
Download Datasheet |
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INTERSIL[Intersil Corporation]
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| Part No. |
ACS125K ACS125D FN3565 ACS125MS 5962F9670501VCC 5962F9670501VXC ACS125HMSR
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| OCR Text |
.... >300K RAD (Si) * Single Event upset (SEU) Immunity: <1 x 10 (Typ)
-10
Errors/Bit/Day
* SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg * Dose Rate upset . . . . . . . . . . . . . . . . >1011 RAD (Si)... |
| Description |
Radiation Hardened Quad Buffer, Three-State
From old datasheet system
Radiation Hardened Quad Buffer Three-State
Radiation Hardened Quad Buffer/ Three-State
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| File Size |
49.98K /
4 Page |
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it Online |
Download Datasheet |
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INTERSIL[Intersil Corporation]
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| Part No. |
ACS86MS ACS86KMSR ACS86K ACS86HMSR ACS86DMSR ACS86D FN3995 CS86HMSR
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| OCR Text |
...se 300K RAD (Si) * Single Event upset (SEU) Immunity <1 x 10-10 Errors/Bit-Day (Typ) * SEU LET Threshold >80 MEV-cm2/mg * Dose Rate upset >10
11
RAD (Si)/s, 20ns Pulse
* Latch-Up Free Under Any Conditions * Military Temperature Range... |
| Description |
From old datasheet system
Radiation Hardened Quad 2-Input Exclusive OR Gate AC SERIES, QUAD 2-INPUT XOR GATE, UUC16
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| File Size |
61.14K /
6 Page |
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it Online |
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INTERSIL[Intersil Corporation]
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| Part No. |
HCS86MS FN3058 HCS86DMSR HCS86D HCS86HMSR HCS86K HCS86KMSR
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| OCR Text |
... >100 MEV-cm2/mg * Single Event upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ) * Dose Rate Survivability: >1 x 1012 RAD (Si)/s * Dose Rate upset >10
10
RAD (Si)/s 20ns Pulse
* Latch-Up Free Under Any Conditions * Military Tempe... |
| Description |
Exclusive-OR Gate, 2-Input, Quad, Rad-Hard, High-Speed, CMOS, Logic
Radiation Hardened Quad 2-Input Exclusive OR Gate
From old datasheet system
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| File Size |
175.65K /
8 Page |
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it Online |
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Intersil
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| Part No. |
HCTS30MS
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| OCR Text |
...100 mev-cm 2 /mg ? single event upset (seu) immunity < 2 x 10 -9 errors/ bit-day (typ) ? dose rate survivability: >1 x 10 12 rad (si)/s ? dose rate upset >10 10 rad (si)/s 20ns pulse ? latch-up free under any conditions ? military temper... |
| Description |
NAND-Gate, 8-Input, TTL Inputs, Rad-Hard, High-Speed, CMOS, Logic
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| File Size |
168.91K /
9 Page |
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it Online |
Download Datasheet |
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